Quote Originally Posted by Jon Ruyle View Post
The problem (I suspect) with measuring pattern noise is that it is more subjective. Right now, DXO sticks to measuring things that can be quantified. I like that approach.
I used to think so, but a lens+camera designer in the UK told me that the military uses several methods for objectively measuring pattern noise that work very well. I forget what they were called, but I think there were some some papers or something published about them. (I know that a FFT is involved at some point.) In any case, it's not really fair to look a gift horse in the mouth by complaining about what they don't measure.